Measuring high aspect ratio and composite micro-trenches without damage is critical for advanced microfabrication, yet ...

Surface metrology has to increasingly deal with the presence of sub-micron thick films, which are now being used on products well beyond semiconductor devices. Sub-micron films may be incidental – for ...

Stellar intensity interferometry is a powerful observational technique that exploits second-order coherence properties of starlight to achieve extremely high angular resolution. Building on the ...

Optical measurement techniques collecting light intensity in the far-field such as conventional and confocal microscopy or coherence scanning interferometry (CSI) enable fast and contactless ...

Traditionally, the form of highly sloped surfaces has been challenging application for optical profilers using coherence scanning interferometry (CSI). Highly sloped surfaces exist in virtually all ...

The fiber itself is used as a transducer in many fiber optic sensing systems (see the section titled “Fiber Sensors,” in ADVANCES IN OPTICAL METROLOGY, the section titled “Optical Fiber Sensors,” in ...

Accurately controlling film thickness and uniformity is extremely important for both throughput and performance in the automotive, aerospace, semiconductor, medical, and research industries. White ...

A technique called plasmonic interferometry helps to detect spatial coherence in 'incoherent' light. A technique called plasmonic interferometry helps to detect spatial coherence in 'incoherent' light ...