Demand for simple and fast test-system connections in multivendor instrument setups pushed Agilent to come up with E2094N I/O Libraries Suite 14.0, which enables error-free connections in under 15 ...
SAN FRANCISCO — LogicVision Inc. and DA-Test have announced a collaboration on low-cost, high-accuracy testing of high speed serializer/ deserializer (serdes) circuits. Using LogicVision's ETSerdes ...
SAN JOSE, Calif. — August 8, 2006 — LogicVision, Inc. (NASDAQ: LGVN), a leading provider of semiconductor test and yield learning solutions, today announced a successful collaboration with DA-Test ...
To succeed in the competitive electronics marketplace, semiconductor companies need silicon that is ready on schedule and with sufficient quality for the target application. Typical devices are ...
Design Automation Conference (DAC), San Francisco, Calif.— July 26, 2006 — LogicVision, Inc. (NASDAQ: LGVN), a leading provider of test and yield learning capabilities and GDA Technologies, Inc, a ...
Redundancy in chiplet interfaces is now a prerequisite for achieving sufficient yield in high-performance computing devices, which today are packed with tens of thousands of interconnects. And as the ...
For both PCIe and Ethernet (IEEE 802.3,) signals are getting mighty small. With PCIe 5 reaching 32 Gbps (NRZ at 32 GBaud) and 802.3 reaching 112 Gbps (PAM4 at 56 GBaud), typical eye-mask limits are ...
The testing included standard installation and upgrade procedures, standard workload testing including Samba, Apache, and Sendmail, as well as file and network I/O testing. All tests were driven by ...
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