For advanced technologies, the industry is seeing very complicated silicon defect types and defect distribution. One consequence is that scan chain diagnosis becomes more difficult. To improve the ...
The complicated silicon defect types and defect distribution of new IC manufacturing technologies can result in very low yield for new designs and technology nodes. During technology qualification ...
Make all clocks and asynchronous resets come from chip pins during scan mode. Ensure that all scan elements on a scan chain are in the same clock domain. Know the requirements and limitations of your ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results