EDN

Testing and Debugging DSP Systems, Part 2

Part one introduces the hardware used for debugging, the debugging challenges facing DSP programmers, and debugging methodologies.Part three explains how emulators control programs on the DSP through ...
Electronic Design

Debugging Low Test-Coverage Situations

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...
EDN

Testing and Debugging DSP Systems, Part 1

Part two explains the workings of the JTAG (IEEE 1149.1) boundary-scan technology. In software development, perhaps the most critical, yet least predictable stage in the process is debugging. Many ...