Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Pickering's toolset accelerates design time, eliminates errors, and simplifies documentation across the test lifecycle.
Detection and monitoring of the yield loss mechanisms and defects in product chips have been a subject of extensive efforts, resulting in multiple useful Design-for-Manufacturing (DFM) and ...
In today’s highly competitive semiconductor industry, chip-design companies strive for competitive advantages by optimizing designs for PPA (Power, Performance, Area). Along with the functional logic, ...
Pickering Interfaces, the leading supplier of modular signal switching and simulation solutions for use in electronic test and verification, has announced Test System Architect, a free online ...
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