Traditional outlier and quality control methodologies often assume that data will conform to ideal, Gaussian distributions. In practice, this is rarely the case. Upstream variability in ...

An new technical paper titled “Fast and Accurate Jitter Modeling for Statistical BER Analysis for Chiplet Interconnect and Beyond” was published by researchers at ...

At DAC this year, I had the pleasure of moderating an intimate chat between Alon Shtepel, senior director for ASIC at Micron, and Abhi Kolpekwar, vice president and general manager for digital ...

The development of a semiconductor system is more complex than just describing functionality in RTL. How ready are AI models to handle the larger task?

A new technical paper titled “A3D-MoE: Acceleration of Large Language Models with Mixture of Experts via 3D Heterogeneous Integration” was published by researchers at Georgia Institute of Technology.

A new technical paper titled “CANDoSA: A Hardware Performance Counter-Based Intrusion Detection System for DoS Attacks on Automotive CAN bus” was published by researchers at Dumarey Softronix and ...

Overlay metrology tools improve accuracy while delivering acceptable throughput, addressing competing requirements in increasingly complex devices. In a race that never ends, on-product overlay ...

Multi-die assemblies require significantly more test data than a monolithic chip. Thermal mismatch between different layers can cause warping, which puts stress on the bonds that connect those layers, ...

Experts At The Table: Making sure AI accelerators can be updated for future requirements is becoming essential due to the rapid introduction of new models. Semiconductor Engineering sat down to ...

One of the biggest changes that came with PCIe 6.0 was the transition from non-return-to-zero (NRZ) signaling to PAM4 signaling. Pulse Amplitude Modulation (PAM) enables more bits to be transmitted at ...

Optical technology is well established for long-haul communications, but the distances it serves are shrinking — especially in the data center. Vertical-cavity surface-emitting lasers (VCSELs) already ...

First-time chip success rates are dropping, primarily due to increased complexity and attempts to cut costs. That means management must take a close look at their verification strategies to determine ...